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SIMS Studies of Tracer Diffusion of Al in Thin Film Nanocrystalline Cu

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摘要 DiffusionofAlinthinfilmnanocrystallineCu(18nm)hasbeeninvestigatedbymeansofsecondionmassspectroscopy(SIMS).Intheexperimentaltemperaturerangesfrom421to773K,thereseem-inglyexiststwodiffusionmechanisms.TheimpurityelementsOandCaresupposedtoaccumulatetothegrainboundariesandinhibitthefastgrainboundarydiffusion.

DOI 6jryn57wd5/1071015

作者

机构地区不详

出处《材料科学技术学报：英文版》 1993年4期

关键词 TRACER DIFFUSION NANOCRYSTALLINE SPECTROSCOPY

分类 [一般工业技术][材料科学与工程]

出版日期 1993年04月14日（中国期刊网平台首次上网日期，不代表论文的发表时间）

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来源期刊

材料科学技术学报：英文版

材料科学技术学报：英文版

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TRACER DIFFUSION NANOCRYSTALLINE SPECTROSCOPY

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