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1 个结果
  • 简介:Detectionofpathdelayfaultsrequirestwo-patterntests.BISTtechniqueprovidesalow-costtestsolution.Thispaperproposesanapproachtodesigningacost-effectivedeterministictestpatterngenerator(IPG)forpathdelaytesting.Givenasetofpre-generatedtest-patterngenerator(TPG)forpathdelaytesting.Givenasetofpre-generatedtest-pairswithpre-determinedfaultcoverage,adeterministicTPGissynthesizedtoapplythegiventest-pairsetinalimitedtesttime.Toachievethisobjective,configuablelinearfeedbackshiftregister(LFSR)structuresareused.TechniquesaredevelopedtosynthesizesuchaTPG.whichisusedtogenerateanunordereddeterministictest-pairset.TheresultingTPGisveryefficientintermsofhardwaresizeandspeedperformance.SImulationofacademicbenchmarkcircuitshasgivengoodresultswhencomparedtoalternativesolutions.

  • 标签: 超大规模集成电路 VLSI 图样发生器 路径延迟检验