简介：Wheninterfaciallayersareviewedasaseparatephase,theinterfacethicknessplaysanessentialroleinassessingphysico-mechanicalpropertiesofparticulatematerials.However,theinterfacethicknessfromsectionalanalysisisoftenoverestimated,duetotheirregularityofsurfacetexturesofgrainsinopaquematerialsthatgivesrisetothenormalofacross-sectionalplanenon-perpendiculartothesurfaceofgrains.Hence,thedeterminationoftheoverestimationdegreeisverycriticaltopreciselyobtaintheinterfacethickness.Thisarticledevelopsanumericalmodelfortheoverestimationdegreeoftheinterfacethicknessaroundanellipsoidalgrainwithanarbitraryaspectratio,byapplyinganaccuratesectionalanalysisalgorithm,andquantitativestereologyandgeometricalprobabilitytheories.Furthermore,onthebasisofthedevelopednumericalmodel,theinfluenceofellipsoidalparticleshapeontheoverestimationdegreeisquantitativelycharacterized.

简介：WepresentthetemperaturedependentelectricaltransportmeasurementsofAg/Si（111）-（√3×√3）R30°bytheinsitumicro-four-pointprobemethodintegratedwithscanningtunnelingmicroscopy.Thesurfacestructurecharacterizationsshowhexagonalpatternsatroomtemperature,whichsupportstheinequivalenttriangle（IET）model.Ametal-insulatortransitionoccursat-115K.Thelowtemperaturetransportmeasurementsclearlyrevealthestronglocalizationcharacteristicsoftheinsulatingphase.